Professional Preparation:

Professional Appointments

Assistant Professor, University of Minnesota, Department of Chemical Engineering and Materials Science, 09/2008-present
Research Associate, Cornell University, School of Applied and Engineering Physics, 2007-2008
Visiting Scientist, IBM T.J. Watson Research Center, Yorktown Heights 2004-2007
Post.Doc. Research Associate, Cornell University, 2004-2007
Research Scientist, Bell Labs, Lucent Technologies, Murray Hill, 1998-1999

Selected Publications

K.A. Mkhoyan, A.W. Contryman, J. Silcox, D.A. Stewart, G. Eda, C. Mattevi, S. Miller, and M. Chhowalla, Atomic and Electronic Structure of Graphene-Oxide, Nano Lett. 9, 1058 (2009)

C. Mattevi, G. Eda, S. Agnoli, S. Miller, K.A. Mkhoyan, O. Celik, D. Mastrogiovanni, G. Gronozzi, E. Garfunkel, and M. Chhowalla, Evalution of Electrical, Chemical, and Structural Properties of Transparent and Conducting Chemically Derived Graphene Tin Films, Adv. Func. Mater. (accepted, in print)

K.A. Mkhoyan, P.E. Batson, J. Cha, W.J. Schaff and J. Silcox, Direct Determination of Local Lattice Polarity in Crystals, Science 312, 1354 (2006)

Other Selected Publications O. Ozatay, K.W. Tan, P.G. Gowtham, J.C. Read, K.A. Mkhoyan, M.G. Thomas, G.D. Fuchs, P.M. Braganca, E.M. Ryan. K.V. Thadani, J.C. Sankey, J. Silcox, D.C. Ralph, R.A. Buhrman, Sidewall Oxide Effects on the Thermal Stability, Magnetic Damping and Low Temperature Reversal Characteristics of Thin Film Nanomagnets, Nature Materials 7, 567 (2008)

K.A. Mkhoyan, S.E. Maccagnano-Zacher, M.G. Thomas and J. Silcox, Critical role of inelastic scattering in quantitative electron microscopy, Phys. Rev. Lett. 100, 025503. (2008)

K.A. Mkhoyan, T. Babinec, S.E. Maccagnano, E.J. Kirkland and J. Silcox, Separation of bulk and surface-losses in low-loss EELS measurements in STEM, Ultramicroscopy 107, 345. (2007)

K.A. Mkhoyan, J. Silcox, A. Ellison, D. Ast, R. Dieckmann, Full recovery of electron damage in glass at ambient temperatures, Phys. Rev. Lett. 96, 205506 (2006)

K.A. Mkhoyan, J. Silcox, E.S. Alldredge, N.W. Ashcroft, H. Lu, W.J. Schaff and L.F. Eastman, Measuring electronic structure of wurtzite InN using electron energy loss spectroscopy, Appl. Phys. Lett. 82, 1407 (2003).